Coverart for item
The Resource Nyquist AD converters, sensor interfaces, and robustness : advances in analog circuit design, 2012, Arthur H.M. van Roermund, Andrea Baschirotto, Michiel Steyaert, editors, (electronic book)

Nyquist AD converters, sensor interfaces, and robustness : advances in analog circuit design, 2012, Arthur H.M. van Roermund, Andrea Baschirotto, Michiel Steyaert, editors, (electronic book)

Label
Nyquist AD converters, sensor interfaces, and robustness : advances in analog circuit design, 2012
Title
Nyquist AD converters, sensor interfaces, and robustness
Title remainder
advances in analog circuit design, 2012
Statement of responsibility
Arthur H.M. van Roermund, Andrea Baschirotto, Michiel Steyaert, editors
Title variation
AACD 2012
Creator
Contributor
Subject
Genre
Language
eng
Summary
This book is based on the presentations during the 21st workshop on Advances in Analog Circuit Design. Expert designers provide readers with information about a variety of topics at the frontier of analog circuit design, including Nyquist analog-to-digital converters, capacitive sensor interfaces, reliability, variability, and connectivity. This book serves as a valuable reference to the state-of-the-art, for anyone involved in analog circuit research and development. Provides a state-of-the-art reference in analog circuit design, written by experts from industry and academia;Presents material in a tutorial-based format;Includes coverage of Nyquist A/D converters, capacitive sensor interfaces, reliability, variability, and connectivity
Member of
Cataloging source
GW5XE
Dewey number
621.382
Index
no index present
LC call number
TK7874
LC item number
.W67 2012
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
2012
http://bibfra.me/vocab/lite/meetingName
Workshop of Advances in Analogue Circuit Design
Nature of contents
dictionaries
http://library.link/vocab/relatedWorkOrContributorDate
1959-
http://library.link/vocab/relatedWorkOrContributorName
  • Roermund, Arthur H. M. van
  • Baschirotto, A.
  • Steyaert, Michiel
http://library.link/vocab/subjectName
  • Linear integrated circuits
  • Analog-to-digital converters
Label
Nyquist AD converters, sensor interfaces, and robustness : advances in analog circuit design, 2012, Arthur H.M. van Roermund, Andrea Baschirotto, Michiel Steyaert, editors, (electronic book)
Instantiates
Publication
Antecedent source
unknown
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
  • GS/s AD Conversion for Broadband Multi-stream Reception
  • Erwin Janssen, Athon Zanikopoulos, Kostas Doris, Claudio Nani and Gerard van der Weide
  • CMOS Ultra-High-Speed Time-Interleaved ADCs
  • Jieh-Tsorng Wu, Chun-Cheng Huang and Chung-Yi Wang
  • CMOS ADCs for Optical Communications
  • Yuriy M. Greshishchev
  • Part 1.
  • Nyquist A/D Converters
  • High Performance Piplined A/D Converters in CMOS and BiCMOS Processes
  • Ahmed M.A. Ali
  • A 12-bit 800 MS/s Dual-Residue Pipeline ADC
  • Jan Mulder, Davide Vecchi, Frank M.L. van der Goes, Jan R. Westra and Emre Ayranci, et al.
  • Time-Interleaved SAR and Slope Converters
  • Pieter Harpe, Ming Ding, Ben Büsze, Cui Zhou and Kathleen Philips, et al.
  • Front End Electronics for Solid State Detectors in Today and Future High Energy Physics Experiments
  • Jan Kaplon and Pierre Jarron
  • Part 2.
  • Capacitive Sensor Interfaces
  • Motion MEMS and Sensors, Today and Tomorrow
  • Benedetto Vigna, E. Lasalandra and T. Ungaretti
  • Energy-Efficient Capacitive Sensor Interfaces
  • Michiel A.P. Pertijs and Zhichao Tan
  • Interface Circuits for MEMS Microphones
  • Piero Malcovati, Marco Grassi and Andrea Baschirotto
  • Analog Circuit Design in Organic Thin-Film Transistor Technologies on Foil: An Overview
  • Hagen Marien, Michiel Steyaert, Erik van Veenendaal and Paul Heremans
  • Impact of Statistical Variability on FinFET Technology: From Device, Statistical Compact Modelling to Statistical Circuit Simulation
  • A. Asenov, B. Cheng, A.R. Brown and X. Wang.9
  • Part 3.
  • Robustness
  • How Can Chips Live Under Radiation?
  • Erik H.M. Heijne
  • Radiation-Tolerant MASH Delta-Sigma Time-to-Digital Converters
  • Ying Cao, Paul Leroux, Wouter De Cock and Michiel Steyaert
  • A Designer's View on Mismatch
  • Marcel Pelgrom, Hans Tuinhout and Maarten Vertregt
Control code
SPR819655039
Dimensions
unknown
Extent
1 online resource.
File format
unknown
Form of item
online
Isbn
9781461445869
Level of compression
unknown
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1007/978-1-4614-4587-6
Quality assurance targets
not applicable
Reformatting quality
unknown
Reproduction note
Electronic resource.
Sound
unknown sound
Specific material designation
remote
Label
Nyquist AD converters, sensor interfaces, and robustness : advances in analog circuit design, 2012, Arthur H.M. van Roermund, Andrea Baschirotto, Michiel Steyaert, editors, (electronic book)
Publication
Antecedent source
unknown
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
  • GS/s AD Conversion for Broadband Multi-stream Reception
  • Erwin Janssen, Athon Zanikopoulos, Kostas Doris, Claudio Nani and Gerard van der Weide
  • CMOS Ultra-High-Speed Time-Interleaved ADCs
  • Jieh-Tsorng Wu, Chun-Cheng Huang and Chung-Yi Wang
  • CMOS ADCs for Optical Communications
  • Yuriy M. Greshishchev
  • Part 1.
  • Nyquist A/D Converters
  • High Performance Piplined A/D Converters in CMOS and BiCMOS Processes
  • Ahmed M.A. Ali
  • A 12-bit 800 MS/s Dual-Residue Pipeline ADC
  • Jan Mulder, Davide Vecchi, Frank M.L. van der Goes, Jan R. Westra and Emre Ayranci, et al.
  • Time-Interleaved SAR and Slope Converters
  • Pieter Harpe, Ming Ding, Ben Büsze, Cui Zhou and Kathleen Philips, et al.
  • Front End Electronics for Solid State Detectors in Today and Future High Energy Physics Experiments
  • Jan Kaplon and Pierre Jarron
  • Part 2.
  • Capacitive Sensor Interfaces
  • Motion MEMS and Sensors, Today and Tomorrow
  • Benedetto Vigna, E. Lasalandra and T. Ungaretti
  • Energy-Efficient Capacitive Sensor Interfaces
  • Michiel A.P. Pertijs and Zhichao Tan
  • Interface Circuits for MEMS Microphones
  • Piero Malcovati, Marco Grassi and Andrea Baschirotto
  • Analog Circuit Design in Organic Thin-Film Transistor Technologies on Foil: An Overview
  • Hagen Marien, Michiel Steyaert, Erik van Veenendaal and Paul Heremans
  • Impact of Statistical Variability on FinFET Technology: From Device, Statistical Compact Modelling to Statistical Circuit Simulation
  • A. Asenov, B. Cheng, A.R. Brown and X. Wang.9
  • Part 3.
  • Robustness
  • How Can Chips Live Under Radiation?
  • Erik H.M. Heijne
  • Radiation-Tolerant MASH Delta-Sigma Time-to-Digital Converters
  • Ying Cao, Paul Leroux, Wouter De Cock and Michiel Steyaert
  • A Designer's View on Mismatch
  • Marcel Pelgrom, Hans Tuinhout and Maarten Vertregt
Control code
SPR819655039
Dimensions
unknown
Extent
1 online resource.
File format
unknown
Form of item
online
Isbn
9781461445869
Level of compression
unknown
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1007/978-1-4614-4587-6
Quality assurance targets
not applicable
Reformatting quality
unknown
Reproduction note
Electronic resource.
Sound
unknown sound
Specific material designation
remote

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