The Resource Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany, Angela Duparre+ѓ, Roland Geyl, Lingli Wang, chairs/editors ; sponsored by SPIE Europe ; cosponsored by Friedrich-Schiller-Universita+{u0088}t Jena (Germany) ; cooperating organizations, EOS--European Optical Society, DGaO--Deutsche Gesellschaft fu+{u0088}r Angewandte Optik e.V. (Germany), Optonet e.V. (Germany), (electronic book)

Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany, Angela Duparre+ѓ, Roland Geyl, Lingli Wang, chairs/editors ; sponsored by SPIE Europe ; cosponsored by Friedrich-Schiller-Universita+{u0088}t Jena (Germany) ; cooperating organizations, EOS--European Optical Society, DGaO--Deutsche Gesellschaft fu+{u0088}r Angewandte Optik e.V. (Germany), Optonet e.V. (Germany), (electronic book)

Label
Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany
Title
Optical fabrication, testing and metrology II
Title remainder
13-15 September 2005, Jena, Germany
Statement of responsibility
Angela Duparre+ѓ, Roland Geyl, Lingli Wang, chairs/editors ; sponsored by SPIE Europe ; cosponsored by Friedrich-Schiller-Universita+{u0088}t Jena (Germany) ; cooperating organizations, EOS--European Optical Society, DGaO--Deutsche Gesellschaft fu+{u0088}r Angewandte Optik e.V. (Germany), Optonet e.V. (Germany)
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
SPIED
Dewey number
681/.4
Illustrations
illustrations
Index
index present
LC call number
TS510
LC item number
.O586 2005
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • Duparré, Angela.
  • Geyl, Roland.
  • Wang, Lingli.
  • Society of Photo-optical Instrumentation Engineers
  • SPIE Europe.
  • Friedrich-Schiller-Universität Jena.
  • European Optical Society.
  • Deutsche Gesellschaft für Angewandte Optik.
  • Optonet (Organization)
  • SPIE Digital Library
Series statement
Proceedings of SPIE,
Series volume
5965
http://library.link/vocab/subjectName
  • Optical instruments
  • Optical instruments
  • Optical materials
  • Metrology
Label
Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany, Angela Duparre+ѓ, Roland Geyl, Lingli Wang, chairs/editors ; sponsored by SPIE Europe ; cosponsored by Friedrich-Schiller-Universita+{u0088}t Jena (Germany) ; cooperating organizations, EOS--European Optical Society, DGaO--Deutsche Gesellschaft fu+{u0088}r Angewandte Optik e.V. (Germany), Optonet e.V. (Germany), (electronic book)
Instantiates
Publication
Bibliography note
Includes bibliographical references and author index
Dimensions
28 cm.
Dimensions
unknown
Extent
1 v. (various pagings)
Form of item
electronic
Other physical details
ill.
Reproduction note
Electronic resource.
Sound
unknown sound
Specific material designation
remote
Label
Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany, Angela Duparre+ѓ, Roland Geyl, Lingli Wang, chairs/editors ; sponsored by SPIE Europe ; cosponsored by Friedrich-Schiller-Universita+{u0088}t Jena (Germany) ; cooperating organizations, EOS--European Optical Society, DGaO--Deutsche Gesellschaft fu+{u0088}r Angewandte Optik e.V. (Germany), Optonet e.V. (Germany), (electronic book)
Publication
Bibliography note
Includes bibliographical references and author index
Dimensions
28 cm.
Dimensions
unknown
Extent
1 v. (various pagings)
Form of item
electronic
Other physical details
ill.
Reproduction note
Electronic resource.
Sound
unknown sound
Specific material designation
remote

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