The Resource Polarimetry and ellipsometry : 20-23 May, 1996, Kazimierz Dolny, Poland, Maksymilian Pluta, Tomasz R. Wolin+ѓski, chairs/editors ; Mariusz Szyjer, co-editor ; organized by, SPIE Poland Chapter, Institute of Applied Optics, Warsaw (Poland) ; sponsored by SPIE--the International Society for Optical Engineering, State Committee for Scientific Research (Poland), (electronic book)

Polarimetry and ellipsometry : 20-23 May, 1996, Kazimierz Dolny, Poland, Maksymilian Pluta, Tomasz R. Wolin+ѓski, chairs/editors ; Mariusz Szyjer, co-editor ; organized by, SPIE Poland Chapter, Institute of Applied Optics, Warsaw (Poland) ; sponsored by SPIE--the International Society for Optical Engineering, State Committee for Scientific Research (Poland), (electronic book)

Label
Polarimetry and ellipsometry : 20-23 May, 1996, Kazimierz Dolny, Poland
Title
Polarimetry and ellipsometry
Title remainder
20-23 May, 1996, Kazimierz Dolny, Poland
Statement of responsibility
Maksymilian Pluta, Tomasz R. Wolin+ѓski, chairs/editors ; Mariusz Szyjer, co-editor ; organized by, SPIE Poland Chapter, Institute of Applied Optics, Warsaw (Poland) ; sponsored by SPIE--the International Society for Optical Engineering, State Committee for Scientific Research (Poland)
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
SPIED
Dewey number
681/.25
Illustrations
illustrations
Index
index present
LC call number
QC440
LC item number
.P63 1997
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • Pluta, Maksymilian
  • Woliński, Tomasz R
  • Szyjer, Mariusz
  • Society of Photo-optical Instrumentation Engineers
  • Institute of Applied Optics (Poland)
  • Komitet Badań Naukowych (Poland)
  • Society of Photo-optical Instrumentation Engineers
  • SPIE Digital Library
Series statement
Proceedings / SPIE--the International Society for Optical Engineering, 0277-786X
Series volume
3094
http://library.link/vocab/subjectName
  • Polarization (Light)
  • Polarimetry
  • Ellipsometry
Label
Polarimetry and ellipsometry : 20-23 May, 1996, Kazimierz Dolny, Poland, Maksymilian Pluta, Tomasz R. Wolin+ѓski, chairs/editors ; Mariusz Szyjer, co-editor ; organized by, SPIE Poland Chapter, Institute of Applied Optics, Warsaw (Poland) ; sponsored by SPIE--the International Society for Optical Engineering, State Committee for Scientific Research (Poland), (electronic book)
Instantiates
Publication
Bibliography note
Includes bibliographical references and index
Dimensions
28 cm.
Dimensions
unknown
Extent
xviii, 374 p.
Form of item
electronic
Other physical details
ill.
Reproduction note
Electronic resource.
Specific material designation
remote
Label
Polarimetry and ellipsometry : 20-23 May, 1996, Kazimierz Dolny, Poland, Maksymilian Pluta, Tomasz R. Wolin+ѓski, chairs/editors ; Mariusz Szyjer, co-editor ; organized by, SPIE Poland Chapter, Institute of Applied Optics, Warsaw (Poland) ; sponsored by SPIE--the International Society for Optical Engineering, State Committee for Scientific Research (Poland), (electronic book)
Publication
Bibliography note
Includes bibliographical references and index
Dimensions
28 cm.
Dimensions
unknown
Extent
xviii, 374 p.
Form of item
electronic
Other physical details
ill.
Reproduction note
Electronic resource.
Specific material designation
remote

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