Coverart for item
The Resource Proceedings of the 11th Asian Test Symposium (ATS'02) : 18-20 November, 2002, Guam, USA, sponsored by IEEE Computer Society Test Technology Technical Council (TTTC) ; in cooperation with Technical Group on Dependable Computing, IEICE, Special Interest Group on System LSI Design Methodology, IPS Japan

Proceedings of the 11th Asian Test Symposium (ATS'02) : 18-20 November, 2002, Guam, USA, sponsored by IEEE Computer Society Test Technology Technical Council (TTTC) ; in cooperation with Technical Group on Dependable Computing, IEICE, Special Interest Group on System LSI Design Methodology, IPS Japan

Label
Proceedings of the 11th Asian Test Symposium (ATS'02) : 18-20 November, 2002, Guam, USA
Title
Proceedings of the 11th Asian Test Symposium (ATS'02)
Title remainder
18-20 November, 2002, Guam, USA
Statement of responsibility
sponsored by IEEE Computer Society Test Technology Technical Council (TTTC) ; in cooperation with Technical Group on Dependable Computing, IEICE, Special Interest Group on System LSI Design Methodology, IPS Japan
Title variation
  • 11th Asian Test Symposium (ATS'02)
  • ATS'02
Creator
Contributor
Subject
Genre
Language
eng
Related
Member of
Cataloging source
WAU
Dewey number
621.3815/48
Illustrations
illustrations
Index
index present
LC call number
TK7888.4
LC item number
.A84 2002a
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
2002
http://bibfra.me/vocab/lite/meetingName
Asian Test Symposium
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • IEEE Computer Society
  • Denshi Jōhō Tsūshin Gakkai (Japan)
  • Jōhō Shori Gakkai (Japan)
http://library.link/vocab/subjectName
  • Electronic digital computers
  • Electronic circuits
  • Fault-tolerant computing
Label
Proceedings of the 11th Asian Test Symposium (ATS'02) : 18-20 November, 2002, Guam, USA, sponsored by IEEE Computer Society Test Technology Technical Council (TTTC) ; in cooperation with Technical Group on Dependable Computing, IEICE, Special Interest Group on System LSI Design Methodology, IPS Japan
Instantiates
Publication
Note
"IEEE Computer Society Order Number PR01825"--Title page verso
Bibliography note
Includes bibliographical references and author index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
mixed
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE52263811
Dimensions
unknown
Extent
1 online resource (xxi, 437 pages)
Form of item
online
Isbn
9780769518251
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Specific material designation
remote
System control number
  • ocm52263811\
  • (OCoLC)52263811
Label
Proceedings of the 11th Asian Test Symposium (ATS'02) : 18-20 November, 2002, Guam, USA, sponsored by IEEE Computer Society Test Technology Technical Council (TTTC) ; in cooperation with Technical Group on Dependable Computing, IEICE, Special Interest Group on System LSI Design Methodology, IPS Japan
Publication
Note
"IEEE Computer Society Order Number PR01825"--Title page verso
Bibliography note
Includes bibliographical references and author index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
mixed
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE52263811
Dimensions
unknown
Extent
1 online resource (xxi, 437 pages)
Form of item
online
Isbn
9780769518251
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Specific material designation
remote
System control number
  • ocm52263811\
  • (OCoLC)52263811

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