Coverart for item
The Resource Proceedings of the 17th Asian Test Symposium : November 24-27, 2008 Sapporo, Japan, sponsored by IEEE Computer Society Test Technology Council (TTTC) [and others]

Proceedings of the 17th Asian Test Symposium : November 24-27, 2008 Sapporo, Japan, sponsored by IEEE Computer Society Test Technology Council (TTTC) [and others]

Label
Proceedings of the 17th Asian Test Symposium : November 24-27, 2008 Sapporo, Japan
Title
Proceedings of the 17th Asian Test Symposium
Title remainder
November 24-27, 2008 Sapporo, Japan
Statement of responsibility
sponsored by IEEE Computer Society Test Technology Council (TTTC) [and others]
Title variation
  • Asian Test Symposium, 2008, ATS '08, 17th
  • 17th Asian Test Symposium
  • Asian Test Symposium
  • ATS 2008
Creator
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
IEEXO
Illustrations
illustrations
Index
index present
LC call number
TK7888.4
LC item number
.A84 2008
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
2008
http://bibfra.me/vocab/lite/meetingName
Asian Test Symposium
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
IEEE Computer Society
http://library.link/vocab/subjectName
  • Electronic digital computers
  • Electronic circuits
  • Fault-tolerant computing
Label
Proceedings of the 17th Asian Test Symposium : November 24-27, 2008 Sapporo, Japan, sponsored by IEEE Computer Society Test Technology Council (TTTC) [and others]
Instantiates
Publication
Note
"IEEE Computer Society Order Number P3396"--Title page verso
Bibliography note
Includes bibliographical references and author index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE440620643
Extent
1 online resource (xxiii, 455 pages)
Form of item
online
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Specific material designation
remote
System control number
  • ocn440620643
  • (OCoLC)440620643
Label
Proceedings of the 17th Asian Test Symposium : November 24-27, 2008 Sapporo, Japan, sponsored by IEEE Computer Society Test Technology Council (TTTC) [and others]
Publication
Note
"IEEE Computer Society Order Number P3396"--Title page verso
Bibliography note
Includes bibliographical references and author index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE440620643
Extent
1 online resource (xxiii, 455 pages)
Form of item
online
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations
Specific material designation
remote
System control number
  • ocn440620643
  • (OCoLC)440620643

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