Coverart for item
The Resource Reliability and radiation effects in compound semiconductors, Allan Johnston, (electronic book)

Reliability and radiation effects in compound semiconductors, Allan Johnston, (electronic book)

Label
Reliability and radiation effects in compound semiconductors
Title
Reliability and radiation effects in compound semiconductors
Statement of responsibility
Allan Johnston
Creator
Subject
Language
eng
Summary
This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. It starts with first principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms. It is the first book that comprehensively covers reliability and radiation effects in optoelectronic as well as microelectronic devices. It contrasts reliability mechanisms of compound semiconductors with those of silicon-based devices, and shows that the reliability of many compound semiconductors has improved to the level where they can be used for ten years or more with low failure rates
Cataloging source
KNOVL
http://library.link/vocab/creatorName
Johnston, Allan
Dewey number
621.38152
Illustrations
illustrations
Index
index present
LC call number
TK7871.99.C65
LC item number
J64 2010eb
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/subjectName
  • Compound semiconductors
  • Compound semiconductors
Label
Reliability and radiation effects in compound semiconductors, Allan Johnston, (electronic book)
Instantiates
Publication
Bibliography note
Includes bibliographical references (p. 356) and index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
Semiconductor fundamentals -- Transistor technologies -- Optoelectronics -- Reliability fundamentals -- Compound semiconductor reliability -- Optoelectronic device reliability -- Radiation environments -- Interactions of radiation with semiconductors -- Displacement damage in compound semiconductors -- Displacement damage in optoelectronic devices -- Radiation damage in optocouplers -- Effects from single particles
Dimensions
24 cm.
Dimensions
unknown
Extent
xii, 363 p.
Form of item
electronic
Isbn
9781615836871
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other physical details
ill.
Reproduction note
Electronic resource.
Specific material designation
remote
Label
Reliability and radiation effects in compound semiconductors, Allan Johnston, (electronic book)
Publication
Bibliography note
Includes bibliographical references (p. 356) and index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
Semiconductor fundamentals -- Transistor technologies -- Optoelectronics -- Reliability fundamentals -- Compound semiconductor reliability -- Optoelectronic device reliability -- Radiation environments -- Interactions of radiation with semiconductors -- Displacement damage in compound semiconductors -- Displacement damage in optoelectronic devices -- Radiation damage in optocouplers -- Effects from single particles
Dimensions
24 cm.
Dimensions
unknown
Extent
xii, 363 p.
Form of item
electronic
Isbn
9781615836871
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other physical details
ill.
Reproduction note
Electronic resource.
Specific material designation
remote

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