Coverart for item
The Resource Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy, Bert Voigtländer, (electronic book)

Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy, Bert Voigtländer, (electronic book)

Label
Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy
Title
Scanning probe microscopy
Title remainder
atomic force microscopy and scanning tunneling microscopy
Statement of responsibility
Bert Voigtländer
Creator
Author
Subject
Language
eng
Summary
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field
Member of
Cataloging source
N$T
http://library.link/vocab/creatorName
Voigtländer, Bert
Dewey number
502.82
Illustrations
illustrations
Index
index present
LC call number
QH212.S33
LC item number
V65 2015eb
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
Series statement
NanoScience and technology,
http://library.link/vocab/subjectName
  • Scanning probe microscopy
  • Atomic force microscopy
  • Scanning tunneling microscopy
Label
Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy, Bert Voigtländer, (electronic book)
Instantiates
Publication
Copyright
Antecedent source
unknown
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
Introduction -- Harmonic Oscillator -- Technical Aspects of Scanning Probe Microscopy -- Scanning Probe Microscopy Designs -- Electronics for Scanning Probe Microscopy -- Lock-In Technique -- Data Representation and Image Processing -- Artifacts in SPM -- Work Function, Contact Potential, and Kelvin Probe Scanning Force Microscopy -- Surface States -- Forces Between Tip and Sample -- Technical Aspects of Atomic force Microscopy (AFM) -- Static Atomic Force Microscopy -- Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy -- Intermittent Contact Mode/Tapping Mode -- Mapping of Mechanical Properties Using Force-Distance Curves -- Frequency Modulation (FM) Mode in Dynamic Atomic Force Microscopy -- Noise in Atomic Force Microscopy -- Quartz Sensors in Atomic force Microscopy -- Scanning Tunneling Microscopy -- Scanning Tunneling Spectroscopy (STS) -- Vibrational Spectroscopy with the STM -- Spectroscopy and Imaging of Surface States -- Building Nanostructures Atom by Atom
Control code
SPR904046390
Dimensions
unknown
Extent
1 online resource
File format
unknown
Form of item
online
Isbn
9783662452394
Level of compression
unknown
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other control number
10.1007/978-3-662-45240-0
Other physical details
illustrations (some color).
Quality assurance targets
not applicable
Reformatting quality
unknown
Reproduction note
Electronic resource.
Sound
unknown sound
Specific material designation
remote
Label
Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy, Bert Voigtländer, (electronic book)
Publication
Copyright
Antecedent source
unknown
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
Introduction -- Harmonic Oscillator -- Technical Aspects of Scanning Probe Microscopy -- Scanning Probe Microscopy Designs -- Electronics for Scanning Probe Microscopy -- Lock-In Technique -- Data Representation and Image Processing -- Artifacts in SPM -- Work Function, Contact Potential, and Kelvin Probe Scanning Force Microscopy -- Surface States -- Forces Between Tip and Sample -- Technical Aspects of Atomic force Microscopy (AFM) -- Static Atomic Force Microscopy -- Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy -- Intermittent Contact Mode/Tapping Mode -- Mapping of Mechanical Properties Using Force-Distance Curves -- Frequency Modulation (FM) Mode in Dynamic Atomic Force Microscopy -- Noise in Atomic Force Microscopy -- Quartz Sensors in Atomic force Microscopy -- Scanning Tunneling Microscopy -- Scanning Tunneling Spectroscopy (STS) -- Vibrational Spectroscopy with the STM -- Spectroscopy and Imaging of Surface States -- Building Nanostructures Atom by Atom
Control code
SPR904046390
Dimensions
unknown
Extent
1 online resource
File format
unknown
Form of item
online
Isbn
9783662452394
Level of compression
unknown
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other control number
10.1007/978-3-662-45240-0
Other physical details
illustrations (some color).
Quality assurance targets
not applicable
Reformatting quality
unknown
Reproduction note
Electronic resource.
Sound
unknown sound
Specific material designation
remote

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