Coverart for item
The Resource Sixth International Workshop on Microprocessor Test and Verification : common challenges and solutions : MTV 2005 : proceedings : Austin, Texas, 3-4 November, 2005, sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), [edited by Magdy S. Abadir and Li-C. Wang]

Sixth International Workshop on Microprocessor Test and Verification : common challenges and solutions : MTV 2005 : proceedings : Austin, Texas, 3-4 November, 2005, sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), [edited by Magdy S. Abadir and Li-C. Wang]

Label
Sixth International Workshop on Microprocessor Test and Verification : common challenges and solutions : MTV 2005 : proceedings : Austin, Texas, 3-4 November, 2005
Title
Sixth International Workshop on Microprocessor Test and Verification
Title remainder
common challenges and solutions : MTV 2005 : proceedings : Austin, Texas, 3-4 November, 2005
Statement of responsibility
sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), [edited by Magdy S. Abadir and Li-C. Wang]
Title variation
  • MTV 2005
  • Microprocessor Test and Verification
Creator
Contributor
Subject
Genre
Language
eng
Related
Member of
Cataloging source
HNK
Dewey number
004.16
Illustrations
illustrations
Index
index present
Language note
English
LC call number
TK7895.M5
LC item number
I585 2005
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
2005
http://bibfra.me/vocab/lite/meetingName
International Workshop on Microprocessor Test and Verification
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorDate
1963-
http://library.link/vocab/relatedWorkOrContributorName
  • Abadir, M
  • Wang, Li-C.
  • IEEE Computer Society
  • Institute of Electrical and Electronics Engineers
http://library.link/vocab/subjectName
  • Microprocessors
  • Integrated circuits
  • Integrated circuits
  • Systems on a chip
  • Electrical Engineering
Label
Sixth International Workshop on Microprocessor Test and Verification : common challenges and solutions : MTV 2005 : proceedings : Austin, Texas, 3-4 November, 2005, sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), [edited by Magdy S. Abadir and Li-C. Wang]
Instantiates
Publication
Note
"IEEE Computer Society Order Number P2627"--[Copyright p]
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE123463251
Dimensions
unknown
Extent
1 online resource (x, 143 pages)
Form of item
online
Isbn
9780769526270
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations (some color)
Sound
unknown sound
Specific material designation
remote
System control number
  • ocn123463251
  • (OCoLC)123463251
Label
Sixth International Workshop on Microprocessor Test and Verification : common challenges and solutions : MTV 2005 : proceedings : Austin, Texas, 3-4 November, 2005, sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), [edited by Magdy S. Abadir and Li-C. Wang]
Publication
Note
"IEEE Computer Society Order Number P2627"--[Copyright p]
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
IEEE123463251
Dimensions
unknown
Extent
1 online resource (x, 143 pages)
Form of item
online
Isbn
9780769526270
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
illustrations (some color)
Sound
unknown sound
Specific material designation
remote
System control number
  • ocn123463251
  • (OCoLC)123463251

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