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The Resource Surface Science Techniques, (electronic book)

Surface Science Techniques, (electronic book)

Label
Surface Science Techniques
Title
Surface Science Techniques
Creator
Contributor
Subject
Genre
Language
eng
Summary
This volume provides a comprehensive and up to the minute review of the techniques used to determine the nature and composition of surfaces. Originally published as a special issue of the Pergamon journal Vacuum, it comprises a carefully edited collection of chapters written by specialists in each of the techniques and includes coverage of the electron and ion spectroscopies, as well as the atom-imaging methods such as the atom probe field ion microscope and the scanning tunnelling microscope. Surface science is an important area of study since the outermost surface layers play a crucial role in processses such as catalysis, adhesion, wear, and corrosion, with applications in metallurgy, thin films and surface coatings, the chemicals and polymer industries, and microelectronics, to name a few. This book covers those techniques used routinely for surface analysis as well as those employed for more fundamental scientific studies. It will be of interest to university research workers, graduate students and to industrial scientists solving practical problems
Member of
Cataloging source
AU-PeEL
http://library.link/vocab/creatorName
Walls, J. M
Dewey number
541.33
LC call number
QC173.4.S94 -- .S9646 1994eb
Nature of contents
dictionaries
http://library.link/vocab/relatedWorkOrContributorName
  • Smith, R
  • Smith, Robin
http://library.link/vocab/subjectName
  • Spectrum analysis
  • Surface chemistry -- Technique
  • Surfaces (Physics) -- Technique
  • Surfaces (Technology)
Label
Surface Science Techniques, (electronic book)
Instantiates
Publication
Note
Description based upon print version of record
Contents
  • Front Cover -- Surface Science Techniques -- Copyright Page -- Table of Contents -- Foreword -- Chapter 1. Surface science techniques -- 1. Introduction -- 2. The electron spectroscopies -- 3. Surface structure determination -- 4. The ion spectroscopies -- 5. The atom imaging techniques -- 6. Discussion -- Chapter 2. X-ray photoelectron spectroscopy -- 1. Introduction -- 2. The basic principles of XPS -- 3. Instrumentation for XPS -- 4. Lateral and depth resolution in XPS -- 5. Analytical uses of XPS -- 6. Concluding remarks -- Acknowledgements -- References
  • Chapter 3. Auger electron spectroscopy -- 1. Introduction -- 2. Historical development -- 3. Physical background -- 4. Instrumentation -- 5. Chemical information -- 6. Quantitative analysis -- Acknowledgements -- References -- Chapter 4. X-ray absorption fine structure for surface studies -- 1. Introduction -- 2. EXAFS -- 3. Near edge structure -- 4. Electron energy-loss fine structure -- 5. Summary -- References -- Chapter 5. Surface infrared spectroscopy -- 1. Historical perspective -- 2. Physical principles -- 3. Other surface vibrational spectroscopies -- 4. Recent applications
  • 5. Conclusions -- References -- Chapter 6. Angle-resolved UV-photoelectron spectroscopy -- 1. Introduction -- 2. Energy and matrix elements -- 3. Electronic structure and chemical identity -- 4. Orientation and symmetry of adsorbed molecules -- 5. Two-dimensional adsorbate band structure -- 6. Final state effects -- 7. Summary and outlook -- Acknowledgement -- References -- CHapter 7. Ballistic simulation in surface science -- 1. Introduction -- 2. Recent developments in simulation codes -- 3. Sputtering simulations -- 4. Ion scattering models -- 5. Ion beam induced topography
  • 6. Ion beam mixing models -- 7. Conclusion and future prospects -- References -- Chapter 8. Secondary ion mass spectrometry -- 1. Introduction -- 2. Sputtering -- 3. Basic characteristics of SIMS -- 4. Quantification of depth profiles -- 5. Commercially available equipment -- References -- Chapter 9. Ion scattering spectroscopy -- 1. Introduction -- 2. Nuclear scattering -- 3. Experimental apparatus -- 4. Experimental techniques -- 5. Future trends -- Acknowledgements -- References -- Chapter 10. Rutherford backscattering and nuclear reaction analysis -- 1. Introduction
  • 2. Energetic ion beam analysis -- 3. Analysis techniques -- 4. Experimental equipment -- 5. Applications -- 6. Conclusions -- References -- Chapter 11. Scanning tunnelling microscopy -- 1. Introduction -- 2. The tunnelling junction -- 3. Atomic resolution imaging -- 4. Single atom tips -- 5. Microscope construction -- 6. Modes of STM operation -- 7. Applications of STM to surface analysis -- 8. Concluding remarks -- References -- Chapter 12. Atom probe field ion microscopy -- 1. Introduction -- 2. Field ion microscopy -- 3. Specimen preparation -- 4. The atom probe -- 5. Types of atom probes
  • 6. Methods of analysis
Control code
PurchEBL1837791
Dimensions
unknown
Extent
1 online resource (197 p.)
Form of item
electronic
Isbn
9781483287881
Specific material designation
remote
Label
Surface Science Techniques, (electronic book)
Publication
Note
Description based upon print version of record
Contents
  • Front Cover -- Surface Science Techniques -- Copyright Page -- Table of Contents -- Foreword -- Chapter 1. Surface science techniques -- 1. Introduction -- 2. The electron spectroscopies -- 3. Surface structure determination -- 4. The ion spectroscopies -- 5. The atom imaging techniques -- 6. Discussion -- Chapter 2. X-ray photoelectron spectroscopy -- 1. Introduction -- 2. The basic principles of XPS -- 3. Instrumentation for XPS -- 4. Lateral and depth resolution in XPS -- 5. Analytical uses of XPS -- 6. Concluding remarks -- Acknowledgements -- References
  • Chapter 3. Auger electron spectroscopy -- 1. Introduction -- 2. Historical development -- 3. Physical background -- 4. Instrumentation -- 5. Chemical information -- 6. Quantitative analysis -- Acknowledgements -- References -- Chapter 4. X-ray absorption fine structure for surface studies -- 1. Introduction -- 2. EXAFS -- 3. Near edge structure -- 4. Electron energy-loss fine structure -- 5. Summary -- References -- Chapter 5. Surface infrared spectroscopy -- 1. Historical perspective -- 2. Physical principles -- 3. Other surface vibrational spectroscopies -- 4. Recent applications
  • 5. Conclusions -- References -- Chapter 6. Angle-resolved UV-photoelectron spectroscopy -- 1. Introduction -- 2. Energy and matrix elements -- 3. Electronic structure and chemical identity -- 4. Orientation and symmetry of adsorbed molecules -- 5. Two-dimensional adsorbate band structure -- 6. Final state effects -- 7. Summary and outlook -- Acknowledgement -- References -- CHapter 7. Ballistic simulation in surface science -- 1. Introduction -- 2. Recent developments in simulation codes -- 3. Sputtering simulations -- 4. Ion scattering models -- 5. Ion beam induced topography
  • 6. Ion beam mixing models -- 7. Conclusion and future prospects -- References -- Chapter 8. Secondary ion mass spectrometry -- 1. Introduction -- 2. Sputtering -- 3. Basic characteristics of SIMS -- 4. Quantification of depth profiles -- 5. Commercially available equipment -- References -- Chapter 9. Ion scattering spectroscopy -- 1. Introduction -- 2. Nuclear scattering -- 3. Experimental apparatus -- 4. Experimental techniques -- 5. Future trends -- Acknowledgements -- References -- Chapter 10. Rutherford backscattering and nuclear reaction analysis -- 1. Introduction
  • 2. Energetic ion beam analysis -- 3. Analysis techniques -- 4. Experimental equipment -- 5. Applications -- 6. Conclusions -- References -- Chapter 11. Scanning tunnelling microscopy -- 1. Introduction -- 2. The tunnelling junction -- 3. Atomic resolution imaging -- 4. Single atom tips -- 5. Microscope construction -- 6. Modes of STM operation -- 7. Applications of STM to surface analysis -- 8. Concluding remarks -- References -- Chapter 12. Atom probe field ion microscopy -- 1. Introduction -- 2. Field ion microscopy -- 3. Specimen preparation -- 4. The atom probe -- 5. Types of atom probes
  • 6. Methods of analysis
Control code
PurchEBL1837791
Dimensions
unknown
Extent
1 online resource (197 p.)
Form of item
electronic
Isbn
9781483287881
Specific material designation
remote

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