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The Resource Surface Science Techniques

Surface Science Techniques

Label
Surface Science Techniques
Title
Surface Science Techniques
Creator
Contributor
Subject
Language
eng
Cataloging source
AU@
http://library.link/vocab/creatorName
Walls, J. M
Dewey number
541.3/3
Index
no index present
LC call number
QC173.4.S94.S9646 1994eb
Literary form
non fiction
Nature of contents
dictionaries
http://library.link/vocab/relatedWorkOrContributorName
  • Smith, R
  • Smith, Robin
http://library.link/vocab/subjectName
  • Spectrum analysis
  • Surface chemistry
  • Surfaces (Physics)
  • Surfaces (Technology)
Label
Surface Science Techniques
Instantiates
Publication
Note
""Chapter 12. Atom probe field ion microscopy""
Contents
  • ""3. Other surface vibrational spectroscopies""""4. Recent applications""; ""5. Conclusions""; ""References""; ""Chapter 6. Angle-resolved UV-photoelectron spectroscopy""; ""1. Introduction""; ""2. Energy and matrix elements""; ""3. Electronic structure and chemical identity""; ""4. Orientation and symmetry of adsorbed molecules""; ""5. Two-dimensional adsorbate band structure""; ""6. Final state effects""; ""7. Summary and outlook""; ""Acknowledgement""; ""References""; ""CHapter 7. Ballistic simulation in surface science""; ""1. Introduction""; ""2. Recent developments in simulation codes""
  • ""3. Sputtering simulations""""4. Ion scattering models""; ""5. Ion beam induced topography""; ""6. Ion beam mixing models""; ""7. Conclusion and future prospects""; ""References""; ""Chapter 8. Secondary ion mass spectrometry""; ""1. Introduction""; ""2. Sputtering""; ""3. Basic characteristics of SIMS""; ""4. Quantification of depth profiles""; ""5. Commercially available equipment""; ""References""; ""Chapter 9. Ion scattering spectroscopy""; ""1. Introduction""; ""2. Nuclear scattering""; ""3. Experimental apparatus""; ""4. Experimental techniques""; ""5. Future trends""
  • ""Acknowledgements""""References""; ""Chapter 10. Rutherford backscattering and nuclear reaction analysis""; ""1. Introduction""; ""2. Energetic ion beam analysis""; ""3. Analysis techniques""; ""4. Experimental equipment""; ""5. Applications""; ""6. Conclusions""; ""References""; ""Chapter 11. Scanning tunnelling microscopy""; ""1. Introduction""; ""2. The tunnelling junction""; ""3. Atomic resolution imaging""; ""4. Single atom tips""; ""5. Microscope construction""; ""6. Modes of STM operation""; ""7. Applications of STM to surface analysis""; ""8. Concluding remarks""; ""References""
Control code
ocn956644801
Dimensions
unknown
Form of item
online
Isbn
9781483287881
Specific material designation
remote
System control number
(OCoLC)956644801
Label
Surface Science Techniques
Publication
Note
""Chapter 12. Atom probe field ion microscopy""
Contents
  • ""3. Other surface vibrational spectroscopies""""4. Recent applications""; ""5. Conclusions""; ""References""; ""Chapter 6. Angle-resolved UV-photoelectron spectroscopy""; ""1. Introduction""; ""2. Energy and matrix elements""; ""3. Electronic structure and chemical identity""; ""4. Orientation and symmetry of adsorbed molecules""; ""5. Two-dimensional adsorbate band structure""; ""6. Final state effects""; ""7. Summary and outlook""; ""Acknowledgement""; ""References""; ""CHapter 7. Ballistic simulation in surface science""; ""1. Introduction""; ""2. Recent developments in simulation codes""
  • ""3. Sputtering simulations""""4. Ion scattering models""; ""5. Ion beam induced topography""; ""6. Ion beam mixing models""; ""7. Conclusion and future prospects""; ""References""; ""Chapter 8. Secondary ion mass spectrometry""; ""1. Introduction""; ""2. Sputtering""; ""3. Basic characteristics of SIMS""; ""4. Quantification of depth profiles""; ""5. Commercially available equipment""; ""References""; ""Chapter 9. Ion scattering spectroscopy""; ""1. Introduction""; ""2. Nuclear scattering""; ""3. Experimental apparatus""; ""4. Experimental techniques""; ""5. Future trends""
  • ""Acknowledgements""""References""; ""Chapter 10. Rutherford backscattering and nuclear reaction analysis""; ""1. Introduction""; ""2. Energetic ion beam analysis""; ""3. Analysis techniques""; ""4. Experimental equipment""; ""5. Applications""; ""6. Conclusions""; ""References""; ""Chapter 11. Scanning tunnelling microscopy""; ""1. Introduction""; ""2. The tunnelling junction""; ""3. Atomic resolution imaging""; ""4. Single atom tips""; ""5. Microscope construction""; ""6. Modes of STM operation""; ""7. Applications of STM to surface analysis""; ""8. Concluding remarks""; ""References""
Control code
ocn956644801
Dimensions
unknown
Form of item
online
Isbn
9781483287881
Specific material designation
remote
System control number
(OCoLC)956644801

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