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The Resource Surface characterization methods : principles, techniques, and applications, edited by Andrew J. Milling

Surface characterization methods : principles, techniques, and applications, edited by Andrew J. Milling

Label
Surface characterization methods : principles, techniques, and applications
Title
Surface characterization methods
Title remainder
principles, techniques, and applications
Statement of responsibility
edited by Andrew J. Milling
Contributor
Subject
Language
eng
Cataloging source
DLC
Index
index present
LC call number
QD506
LC item number
.S7837 1999
Literary form
non fiction
Nature of contents
bibliography
http://library.link/vocab/relatedWorkOrContributorDate
1965-
http://library.link/vocab/relatedWorkOrContributorName
Milling, Andrew J.
Series statement
Surfactant science series
Series volume
87
http://library.link/vocab/subjectName
  • Surface chemistry
  • Interfaces (Physical sciences)
Label
Surface characterization methods : principles, techniques, and applications, edited by Andrew J. Milling
Instantiates
Publication
Bibliography note
Includes bibliographical references and index
Carrier category
volume
Carrier category code
  • nc
Carrier MARC source
rdacarrier
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
  • X-Ray Photoelectron Spectroscopy (XPS) and Static Secondary Ion Mass Spectrometry (SSIMS) of Biomedical Polymers and Surfactants
  • Kevin M. Shakesheff, Martyn C. Davies, Robert Langer
  • Evanescent Wave Scattering at Solid Surfaces
  • Adolfas K. Gaigalas
  • Characterizing Colloidal Materials Using Dynamic Light Scattering
  • Leo H. Hanus, Harry J. Ploehn
  • Light Scattering Studies of Microcapsules in Suspension
  • Toshiaki Dobashi, Benjamin Chu
  • Three-Dimensional Particle Tracking of Micronic Colloidal Particles
  • Y. Grasselli, Georges Bossis
  • Measurement of the Surface Tension and Surface Stress of Solids
  • Low-Mass Luminescent Organogels
  • Pierre Terech, Richard G. Weiss
  • Chromatographic Methods for Measurement of Antibody-Antigen Association Rates
  • Claire Vidal-Madjar, Alain Jaulmes
  • The Acid-Base Behavior of Proteins Determined by ISFETs
  • Wouter Olthuis, Piet Bergveld
  • Hans-Jurgen Butt, Roberto Raiteri
  • Contact Angle Techniques and Measurements
  • Daniel Y. Kwok, A.W. Neumann
  • Measurement of Ion-Mediated and van der Waals Forces Using Atomic Force Microscopy
  • Ian Larson, Andrew J. Milling
  • Measurement of Electro-osmosis as a Method for Electrokinetic Surface Analysis
  • Norman L. Burns
Control code
980099027808
Dimensions
24 cm.
Extent
viii, 412 p
Isbn
9780824773366
Lccn
lc99027808
Media category
unmediated
Media MARC source
rdamedia
Media type code
  • n
Other physical details
ill
Label
Surface characterization methods : principles, techniques, and applications, edited by Andrew J. Milling
Publication
Bibliography note
Includes bibliographical references and index
Carrier category
volume
Carrier category code
  • nc
Carrier MARC source
rdacarrier
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
  • X-Ray Photoelectron Spectroscopy (XPS) and Static Secondary Ion Mass Spectrometry (SSIMS) of Biomedical Polymers and Surfactants
  • Kevin M. Shakesheff, Martyn C. Davies, Robert Langer
  • Evanescent Wave Scattering at Solid Surfaces
  • Adolfas K. Gaigalas
  • Characterizing Colloidal Materials Using Dynamic Light Scattering
  • Leo H. Hanus, Harry J. Ploehn
  • Light Scattering Studies of Microcapsules in Suspension
  • Toshiaki Dobashi, Benjamin Chu
  • Three-Dimensional Particle Tracking of Micronic Colloidal Particles
  • Y. Grasselli, Georges Bossis
  • Measurement of the Surface Tension and Surface Stress of Solids
  • Low-Mass Luminescent Organogels
  • Pierre Terech, Richard G. Weiss
  • Chromatographic Methods for Measurement of Antibody-Antigen Association Rates
  • Claire Vidal-Madjar, Alain Jaulmes
  • The Acid-Base Behavior of Proteins Determined by ISFETs
  • Wouter Olthuis, Piet Bergveld
  • Hans-Jurgen Butt, Roberto Raiteri
  • Contact Angle Techniques and Measurements
  • Daniel Y. Kwok, A.W. Neumann
  • Measurement of Ion-Mediated and van der Waals Forces Using Atomic Force Microscopy
  • Ian Larson, Andrew J. Milling
  • Measurement of Electro-osmosis as a Method for Electrokinetic Surface Analysis
  • Norman L. Burns
Control code
980099027808
Dimensions
24 cm.
Extent
viii, 412 p
Isbn
9780824773366
Lccn
lc99027808
Media category
unmediated
Media MARC source
rdamedia
Media type code
  • n
Other physical details
ill

Library Locations

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      Ashton Street, Liverpool, L69 3DA, GB
      53.418074 -2.967913
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