The Resource Technologies for synthetic environments : hardware-in-the-loop testing V : 24-26 April, 2000, Orlando, [Florida] USA, Robert Lee Murrer, Jr., chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering, (electronic book)

Technologies for synthetic environments : hardware-in-the-loop testing V : 24-26 April, 2000, Orlando, [Florida] USA, Robert Lee Murrer, Jr., chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering, (electronic book)

Label
Technologies for synthetic environments : hardware-in-the-loop testing V : 24-26 April, 2000, Orlando, [Florida] USA
Title
Technologies for synthetic environments
Title remainder
hardware-in-the-loop testing V : 24-26 April, 2000, Orlando, [Florida] USA
Statement of responsibility
Robert Lee Murrer, Jr., chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering
Title variation
Hardware-in-the-loop testing V
Contributor
Subject
Genre
Language
eng
Member of
Cataloging source
SPIED
Illustrations
illustrations
Index
index present
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • Murrer, Robert Lee
  • Society of Photo-optical Instrumentation Engineers
Series statement
SPIE proceedings series
Series volume
4027
http://library.link/vocab/subjectName
  • Guided missiles
  • Infrared detectors
  • Guidance systems (Flight)
Label
Technologies for synthetic environments : hardware-in-the-loop testing V : 24-26 April, 2000, Orlando, [Florida] USA, Robert Lee Murrer, Jr., chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering, (electronic book)
Instantiates
Publication
Bibliography note
Includes bibliographical references and author index
Dimensions
28 cm.
Dimensions
unknown
Extent
ix, 410 p.
Form of item
electronic
Other physical details
ill.
Reproduction note
Electronic resource.
Specific material designation
remote
Label
Technologies for synthetic environments : hardware-in-the-loop testing V : 24-26 April, 2000, Orlando, [Florida] USA, Robert Lee Murrer, Jr., chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering, (electronic book)
Publication
Bibliography note
Includes bibliographical references and author index
Dimensions
28 cm.
Dimensions
unknown
Extent
ix, 410 p.
Form of item
electronic
Other physical details
ill.
Reproduction note
Electronic resource.
Specific material designation
remote

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