Coverart for item
The Resource Wafer-level testing and test during burn-in for integrated circuits, Sudarshan Bahukudumbi, Krishnendu Chakrabarty, (electronic book)

Wafer-level testing and test during burn-in for integrated circuits, Sudarshan Bahukudumbi, Krishnendu Chakrabarty, (electronic book)

Label
Wafer-level testing and test during burn-in for integrated circuits
Title
Wafer-level testing and test during burn-in for integrated circuits
Statement of responsibility
Sudarshan Bahukudumbi, Krishnendu Chakrabarty
Creator
Contributor
Subject
Language
eng
Summary
Wafer-level testing refers to a critical process of subjecting integrated circuits and semiconductor devices to electrical testing while they are still in wafer form. Burn-in is a temperature/bias reliability stress test used in detecting and screening out potential early life device failures. This hands-on resource provides a comprehensive analysis of these methods, showing how wafer-level testing during burn-in (WLTBI) helps lower product cost in semiconductor manufacturing. Engineers learn how to implement the testing of integrated circuits at the wafer-level under various resource constraints. Moreover, this book helps practitioners address the issue of enabling next generation products with previous generation testers. Practitioners also find expert insights on current industry trends in WLTBI test solutions
Member of
Cataloging source
CaPaEBR
http://library.link/vocab/creatorName
Bahukudumbi, Sudarshan
Dewey number
621.38132
Illustrations
illustrations
Index
index present
LC call number
TK7874
LC item number
.B35 2010eb
Literary form
non fiction
Nature of contents
  • standards specifications
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
Chakrabarty, Krishnendu
http://library.link/vocab/subjectName
  • Integrated circuits
  • Integrated circuits
  • Semiconductors
Label
Wafer-level testing and test during burn-in for integrated circuits, Sudarshan Bahukudumbi, Krishnendu Chakrabarty, (electronic book)
Instantiates
Publication
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Control code
ebr10412729
Dimensions
unknown
Extent
xv, 198 p.
Form of item
electronic
Isbn
9781596939899
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Original version note
Original electronic resource
Other physical details
ill.
Reproduction note
Electronic resource.
Specific material designation
remote
Label
Wafer-level testing and test during burn-in for integrated circuits, Sudarshan Bahukudumbi, Krishnendu Chakrabarty, (electronic book)
Publication
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Control code
ebr10412729
Dimensions
unknown
Extent
xv, 198 p.
Form of item
electronic
Isbn
9781596939899
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Original version note
Original electronic resource
Other physical details
ill.
Reproduction note
Electronic resource.
Specific material designation
remote

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