Boeing Company
Resource Information
The organization Boeing Company represents an institution, an association, or corporate body that is associated with resources found in Sydney Jones Library, University of Liverpool.
The Resource
Boeing Company
Resource Information
The organization Boeing Company represents an institution, an association, or corporate body that is associated with resources found in Sydney Jones Library, University of Liverpool.
- Label
- Boeing Company
- Authority link
- http://id.loc.gov/authorities/names/n79134057
62 Items by the Organization Boeing Company
Context
Context of Boeing CompanyContributor of
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- Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002, Seattle, Washington, USA
- Advanced signal processing algorithms, architectures, and implementations XII : 9-1 July, 2002, Seattle, Washington, USA
- Advanced signal processing algorithms, architectures, and implementations XIII : 6-8 August, 2003, San Diego, California, USA
- Advances in laboratory-based X-ray sources and optics III : 8 July, 2002, Seattle, Washington, USA
- Advances in neutron scattering instrumentation : 7-8 July, 2002, Seattle, Washington, USA
- Airborne reconnaissance XXVI : 10-11 July, 2002, Seattle, Washington, USA
- Algorithms and systems for optical information processing VI : 8-10 July, 2002, Seattle, Washington, USA
- Applications and science of neural networks, fuzzy systems, and evolutionary computation V : 9-10 July, 2002, Seattle, Washington, USA
- Applications of digital image processing XXV : 8-10 July, 2002, Seattle, Washington, USA
- Atmospheric radiation measurements and applications in climate : 10-11 July 2002, Seattle, [Washington] USA
- Boeing Frontiers
- Cryogenic optical systems and instruments IX : 8 July, 2002, Seattle, Washington, USA
- Crystal materials for nonlinear optical devices and microgravity science : 8-9 July, 2002, Seattle, Washington, USA
- Current developments in lens design and optical engineering III : 8-9 July, 2002, Seattle, [Washington] USA
- Design and fabrication of planar optical waveguide devices and materials : 8-9 July, 2002, Seattle, Washington, USA
- Design and microfabrication of novel x-ray optics : 9 July, 2002, Seattle, Washington, USA
- Design and microfabrication of novel x-ray optics II : 5-6 August 2004, Denver, Colorado, USA
- Diode lasers and applications in atmospheric sensing : 10-11 July 2002, Seattle, USA
- Earth observing systems VII : 7-10 July, 2002, Seattle, [Washington] USA
- Electro-optical system design, simulation, testing, and training : 9-10 July, 2002, Seattle, Washington, USA
- High-resolution wavefront control : methods, devices and applications IV : 8-9 July, 2002, Seattle, Washington, USA
- Image reconstruction from incomplete data II : 8-9 July, 2002, Seattle, Washington, USA
- Imaging spectrometry VIII : 8-10 July, 2002, Seattle, Washington, USA
- Infrared spaceborne remote sensing X : 10-11 July, 2002, Seattle, Washington, USA
- Infrared technology and applications XXVIII : 7-11 July, 2002, Seattle, Washington, USA
- Interferometry XI : applications, 10-11 July 2002, Seattle USA
- Interferometry XI : techniques and analysis, 8-10 July 2002, Seattle USA
- Laser beam shaping III : 9 and 11 July, 2002, Seattle, Washington, USA
- Liquid crystals VI : 8-9 July, 2002, Seattle, Washington, USA
- Low-light-level and real-time imaging systems, components, and applications : 9-11 July 2002, Seattle, Washington, USA
- Materials for infrared detectors II : 8-9 July, 2002, Seattle, Washington, USA
- Mathematics of data/image coding, compression, and encryption V, with applications : 9-10 July 2002, Seattle, Washington, USA
- Modeling and characterization of light sources : 8-9 July 2002, Seattle, [Washington] USA
- Multiphoton absorption and nonlinear transmission processes : materials, theory, and applications : 8-9 July 2002, Seattle, Washington, USA
- Nanoscale optics and applications : 8-9 July, 2002, Seattle, Washington, USA
- Nonlinear spectroscopy : 8-9 July 2002, Seattle, Washington, USA
- Novel optical systems design and optimization V : 9 July, 2002, Seattle, [Washington] USA
- Optical design and analysis software II : 9-10 July 2002, Seattle, [Washington] USA
- Optical properties of nanocrystals : 9-11 July, 2002, Seattle, Washington, USA
- Optical scanning, 2002 : 9 July 1999, Seattle, USA
- Optical system contamination : effects, measurements, and control VII : 9-11 July, 2002, Seattle, [Washington] USA
- Optomechanical design and engineering 2002 : 7-9 July, Seattle, [Washington] USA
- Organic light-emitting materials and devices VI : 8-10 July, 2002, Seattle, Washington, USA
- Organic photorefractive and photosensitive materials for holographic applications : 9 July, 2002, Seattle, Washington, USA
- Organic photovoltaics III : 10-11 July, 2002, Seattle, Washington, USA
- Penetrating radiation systems and applications IV : 9-11 July, 2002, Seattle, Washington, USA
- Photonic devices and algorithms for computing IV : 8-9 July, 2002, Seattle, Washington, USA
- Photonics for space environments VIII : 9-10 July, 2002, Seattle, Washington, USA
- Photorefractive fiber and crystal devices : materials, optical properties, and applications VIII : 9-11 July, 2002, Seattle, Washington, USA
- Physical chemistry of interfaces and nanomaterials : 7-9 July 2002, Seattle, Washington, USA
- Polarization measurement, analysis, and applications V : 8-9 July 2002, Seattle, [Washington] USA
- Properties of metal nanostructures : 10-11 July, 2002, Seattle, Washington, USA
- SPACE TECHNOLOGY AND APPLICATIONS INTERNATIONAL FORUM - 2000
- Smart structures and materials 2001 : 5-8 March 2001, Newport Beach, USA, Modeling, signal processing, and control in smart structures
- Sol-gel optics VI : 10-11 July, 2002, Seattle, Washington, USA
- Solid state lighting II : 9-11 July, 2002, Seattle, Washington, USA
- Space technology and applications international forum -1999
- Superconducting and related oxides : physics and nanoengineering V : 8-11 July, 2002, Seattle, Washington, USA
- Surface scattering and diffraction for advanced metrology II : 9 July, 2002, Seattle, Washington, USA
- Vision geometry XI : 7-8 July, 2002, Seattle, Washington, USA
- X-ray and gamma-ray detectors and applications IV : 7-9 July Seattle, Washington, USA
- X-ray mirrors, crystals, and multilayers II : 10-11 July, 2002, Seattle, Washington, USA
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.liverpool.ac.uk/resource/DF7HJjZm7ZY/" typeof="Organization http://bibfra.me/vocab/lite/Organization"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.liverpool.ac.uk/resource/DF7HJjZm7ZY/">Boeing Company</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.liverpool.ac.uk/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.liverpool.ac.uk/">Sydney Jones Library, University of Liverpool</a></span></span></span></span></div>
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.liverpool.ac.uk/resource/DF7HJjZm7ZY/" typeof="Organization http://bibfra.me/vocab/lite/Organization"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.liverpool.ac.uk/resource/DF7HJjZm7ZY/">Boeing Company</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.liverpool.ac.uk/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.liverpool.ac.uk/">Sydney Jones Library, University of Liverpool</a></span></span></span></span></div>
