National Institute of Standards and Technology (U.S.)
Resource Information
The organization National Institute of Standards and Technology (U.S.) represents an institution, an association, or corporate body that is associated with resources found in University of Liverpool.
The Resource
National Institute of Standards and Technology (U.S.)
Resource Information
The organization National Institute of Standards and Technology (U.S.) represents an institution, an association, or corporate body that is associated with resources found in University of Liverpool.
- Label
- National Institute of Standards and Technology (U.S.)
- Authority link
- http://id.loc.gov/authorities/names/n88112126
78 Items by the Organization National Institute of Standards and Technology (U.S.)
2 Items that are about the Organization National Institute of Standards and Technology (U.S.)
Context
Context of National Institute of Standards and Technology (U.S.)Contributor of
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- CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY: 2003 International Conference on Characterization and Metrology for ULSI Technology
- Chemistry- and biology-based technologies for contraband detection : 20-21 November, 1996, Boston, Massachusetts
- Command, control, communications, and intelligence systems for law enforcement : 19-21 November 1996, Boston, Massachusetts
- Computerization and networking of materials databases, fourth volume
- Crime scene investigation : a guide for law enforcement
- Forensic evidence analysis and crime scene investigation : 20-21 November 1996, Boston, Massachusetts
- Harnessing light : optical science and metrology at NIST : 1 August 2001, San Diego, USA
- Human detection and positive identification : methods and technologies : 19, 21 November 1996, Boston, Massachusetts
- IEEE 9th VLSI Packaging Workshop in Japan : VPWJ 2008 : December 1st-2nd, 2008, the Westin Miyako Kyoto, Kyoto, Japan
- IT Professional Conference : challenges in information systems governance : National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA, 22 May 2014
- Instrumentation, metrology, and standards for nanomanufacturing IV : 2-4 August 2010, San Diego, California, United States
- Instrumentation, metrology, and standards for nanomanufacturing, optics, and semiconductors V : 24-25 August 2011, San Diego, California, United States
- Instrumentation, metrology, and standards for nanomanufacturing, optics, and semiconductors VI : 13-14 August 2012, San Diego, California, United States
- Intelligent robots and computer vision XVI : algorithms, techniques, active vision, and materials handling : 15-17 October, 1997, Pittsburgh, Pennsylvania
- Intelligent transportation systems : 15-17 October 1997, Pittsburgh, Pennsylvania
- Investigative image processing : 19-20 November 1996, Boston, Massachusetts
- Journal of research of the National Bureau of Standards
- Journal of research of the National Institute of Standards and Technology
- Laser induced damage in optical materials, 1986 : proceedings of a symposium
- Laser induced damage in optical materials, 1987 : proceedings of a symposium
- Laser induced damage in optical materials, 1989
- Laser-induced damage in optical materials, 1990
- Laser-induced damage in optical materials, 2011 : 43rd Annual Laser Damage Symposium : proceedings : 18-21 September 2010, Boulder, Colorado
- Machine learning for multimodal interaction : third international workshop, MLMI 2006, Bethesda, MD, USA, May 1-4, 2006 : revised selected papers
- Machine vision applications, architectures, and systems integration VI : 15-16 October 1997, Pittsburgh, Pennsylvania
- Microelectronic structures and MEMS for optical processing II : 14-15 October 1996, Austin, Texas
- Microelectronic structures and MEMS for optical processing III : 29-30 September, 1997, Austin, Texas
- Microelectronic structures and microelectromechanical devices for optical processing and multimedia applications : 24 October, 1995, Austin, Texas
- Microlithography and metrology in micromachining : 23-24 October, 1995, Austin, Texas
- Microlithography and metrology in micromachining II : 14-15 October, 1996, Austin, Texas
- Microlithography and metrology in micromachining III : 29-30 September, 1997, Austin, Texas
- Micromachined devices and components : 23-24 October, 1995, Austin, Texas
- Micromachined devices and components II : 14-15 October 1996, Austin, Texas
- Micromachined devices and components III : 29 September 1997, Austin, Texas
- Micromachining and microfabrication process technology : 23-24 October, 1995, Austin, Texas
- Micromachining and microfabrication process technology II : 14-15 October, 1996, Austin, Texas
- Micromachining and microfabrication process technology III : 29-30 September, 1997, Austin, Texas
- Microrobotics and microsystem fabrication : 16-17 October 1997, Pittsburgh, Pennsylvania
- Mobile robots XII : 16 October, 1997, Pittsburgh, Pennsylvania
- NIST handbook of mathematical functions
- Nanostructure science, metrology, and technology : 5-7 September 2001, Gaithersburg, USA
- National and international law enforcement databases : 19-20 November 1996, Boston, Massachusetts
- Nondestructive evaluation of aging aircraft, airports, and aerospace hardware II : 31 March-2 April 1998, San Antonio, Texas
- Nondestructive evaluation of materials and composites II : 31 March-1 April 1998, San Antonio, Texas
- Nondestructive evaluation of utilities and pipelines II : 1 April, 1998, San Antonio, Texas
- Physics-based technologies for the detection of contraband : 19-20 November 1996, Boston, Massachusetts
- Proceedings : 2002 IEEE 4th International Workshop on Networked Appliances, January 15-16 2002, National Institute of Standards and Technology, Gaithersburg, MD
- Proceedings : fourth ACM Workshop on Role-Based Access Control, Fairfax, Virginia, USA, October 28-29, 1999
- Proceedings of the ... IEEE International Symposium on Intelligent Control
- Proceedings of the 1998 IEEE International Symposium on Intelligent Control (ISIC) : held jointly with IEEE International Symposium on Computational Intelligence in Robotics and Automation (CIRA) ; Intelligent Systems and Semiotics (ISAS) : September 14-17, 1998, National Institute of Standards and Technology, Gaithersburg, Maryland, USA
- Process control and sensors for manufacturing : 31 March-1 April 1998, San Antonio, Texas
- RAWCON 2001 : 2001 IEEE Radio and Wireless Conference : Waltham, Massachusetts, USA, August 19-22, 2001
- Security systems and nonlethal technologies for law enforcement : 19, 21 November 1996, Boston, Massachussetts
- Sensor fusion and decentralized control in autonomous robotic systems : 14-15 October, 1997, Pittsburgh, Pennsylvania
- Sensors and controls for advanced manufacturing : 14-15 October 1997, Pittsburgh, Pennsylvania
- Twenty Fourth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : proceedings 2008, San Jose, CA USA, March 16-20, 2008
- Twenty Second Annual IEEE Semiconductor Thermal Measurement and Management Symposium : SEMI-THERM proceedings 2006 : Dallas, TX, USA, March 14-16, 2006
- Twenty Seventh Annual IEEE Semiconductor Thermal Measurement and Management Symposium : proceedings 2011 : San Jose, CA, USA : March 20-24, 2011
- 1994 Conference on Precision Electromagnetic Measurements digest : 27 June - 1 July, 1994, Boulder, Colorado, USA
- 2017 IEEE 28th Annual Software Technology Conference (STC)
- 2017 International Conference on Optical MEMS and Nanophotonics (OMN) : proceedings : August 13-17, 2017, Santa Fe, New Mexico, USA
- Architectures, networks, and intelligent systems for manufacturing integration : 15-16 October 1997, Pittsburgh, Pennsylvania
- Best Practices in Assessment of Research and Development Organizations: Summary of a Workshop
- Twenty First Annual IEEE Semiconductor Thermal Measurement and Management Symposium : proceedings 2005 : San Jose, CA, USA, March 15-17, 2005
- Twenty Ninth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : SEMI-THERM : proceedings 2013, San Jose, CA USA, March 17-21, 2013
- Seventh International Conference on Software Security and Reliability : proceedings : 18-20 June 2013, Gaithersburg, Maryland
- Simulation Conference (WSC), Proceedings of the 2012 Winter : date 9-12 Dec. 2012
- Strengthening American Manufacturing: The Role of the Manufacturing Extension Partnership : Summary of a Symposium
- Surveillance and assessment technologies for law enforcement : 19-20 November 1996, Boston, Massachusetts
- Technical digest : Symposium on Optical Fiber Measurements, 2002 [sic] : digest of a symposium : September 28-30, 2004, National Institute of Standards and Technology, Boulder, Colorado 80305
- Telemanipulator and telepresence technologies IV : 14-15 October, 1997, Pittsburgh, Pennsylvania
- Terrorism and counterterrorism methods and technologies : 20-21 November 1996, Boston, Massachusetts
- Testing, reliability, and application of micro- and nano-material systems : 3-5 March, 2003, San Diego, California
- Third International Conference on Smart Materials and Nanotechnology in Engineering : 5-8 December 2011, Shenzhen, China
- Training, education, and liability issues for law enforcement scientists and engineers : 21 November 1996, Boston, Massachusetts
- Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : San Jose, CA, USA, March 9-11, 2004
- Twenty Eighth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : SEMI-THERM : proceedings 2012, San Jose, CA USA, March 18-22, 2012
- Twenty Fifth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : proceedings 2009, San Jose, CA USA, March 15-19, 2009
Focus of
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- IT Professional Conference : challenges in information systems governance : National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA, 22 May 2014
- Simulation Conference (WSC), Proceedings of the 2012 Winter : date 9-12 Dec. 2012
- Twenty Seventh Annual IEEE Semiconductor Thermal Measurement and Management Symposium : proceedings 2011 : San Jose, CA, USA : March 20-24, 2011
- Seventh International Conference on Software Security and Reliability : proceedings : 18-20 June 2013, Gaithersburg, Maryland
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.liverpool.ac.uk/resource/YI79OjoTXYg/" typeof="Organization http://bibfra.me/vocab/lite/Organization"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.liverpool.ac.uk/resource/YI79OjoTXYg/">National Institute of Standards and Technology (U.S.)</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.liverpool.ac.uk/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.liverpool.ac.uk/">University of Liverpool</a></span></span></span></span></div>
