ESD : failure mechanisms and models

Resource Information

The work ESD : failure mechanisms and models represents a distinct intellectual or artistic creation found in Sydney Jones Library, University of Liverpool. This resource is a combination of several types including: Work, Language Material, Books.

Label

ESD : failure mechanisms and models

Title remainder

failure mechanisms and models

Statement of responsibility

Steven H. Voldman

Title variation

Electrostatic discharge

Creator

• Voldman, Steven H

Subject

• Electrostatics
• Integrated circuits -- Protection
• Integrated circuits -- Reliability
• Integrated circuits -- Testing
• Semiconductors -- Failures
• Electric discharges

Language

eng

Summary

Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrical overstress, ESD, and latchup from a failure analysis and case-study approach. It provides a clear insight into the physics of failure from a generalist perspective, followed by investigation of failure mechanisms in specific technologies, circuits, and systems. The book is unique in covering both the failure mechanism and the practical solutions to fix the problem from either a technology or circuit method

Cataloging source

CaPaEBR

Dewey number

621.381

Index

index present

LC call number

TK7871.852

LC item number

.V65 2009eb

Literary form

non fiction

Nature of contents

• standards specifications
• bibliography