Coverart for item
The Resource An introduction to mixed-signal IC test and measurement, Gordon Roberts, Friedrich Taenzler, Mark Burns, (electronic book)

An introduction to mixed-signal IC test and measurement, Gordon Roberts, Friedrich Taenzler, Mark Burns, (electronic book)

Label
An introduction to mixed-signal IC test and measurement
Title
An introduction to mixed-signal IC test and measurement
Statement of responsibility
Gordon Roberts, Friedrich Taenzler, Mark Burns
Creator
Contributor
Subject
Language
eng
Summary
"With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topics will help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples, exercises and problems"--Provided by publisher
Member of
Cataloging source
KNOVL
http://library.link/vocab/creatorDate
1959-
http://library.link/vocab/creatorName
Roberts, Gordon W.
Dewey number
621.3815
Illustrations
illustrations
Index
index present
LC call number
TK7874
LC item number
.B825 2012eb
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorDate
1962-
http://library.link/vocab/relatedWorkOrContributorName
  • Taenzler, Friedrich
  • Burns, Mark
Series statement
The Oxford series in electrical and coputer engineering
http://library.link/vocab/subjectName
  • Integrated circuits
  • Mixed signal circuits
Label
An introduction to mixed-signal IC test and measurement, Gordon Roberts, Friedrich Taenzler, Mark Burns, (electronic book)
Instantiates
Publication
Note
Burns' name appears first on the previous edition
Antecedent source
unknown
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
Overview of mixed-signal testing -- Tester hardware -- DC and parametric measurements -- Data analysis and probability theory -- Yield, measurement accuracy, and test time -- DAC testing -- ADC testing -- Sampling theory -- DSP-based testing -- Analog channel testing -- Sampled channel testing -- Fundamentals of RF testing -- RF test methods -- Clock and serial data communications channel measurements -- Tester interfacing--DIB design -- Design for test (DfT)
Dimensions
unknown
Edition
2nd ed.
Extent
1 online resource (xxv, 836 p.)
File format
unknown
Form of item
online
Isbn
9781613449486
Level of compression
unknown
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other physical details
ill.
Quality assurance targets
not applicable
Reformatting quality
unknown
Reproduction note
Electronic resource.
Sound
unknown sound
Specific material designation
remote
Label
An introduction to mixed-signal IC test and measurement, Gordon Roberts, Friedrich Taenzler, Mark Burns, (electronic book)
Publication
Note
Burns' name appears first on the previous edition
Antecedent source
unknown
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
Overview of mixed-signal testing -- Tester hardware -- DC and parametric measurements -- Data analysis and probability theory -- Yield, measurement accuracy, and test time -- DAC testing -- ADC testing -- Sampling theory -- DSP-based testing -- Analog channel testing -- Sampled channel testing -- Fundamentals of RF testing -- RF test methods -- Clock and serial data communications channel measurements -- Tester interfacing--DIB design -- Design for test (DfT)
Dimensions
unknown
Edition
2nd ed.
Extent
1 online resource (xxv, 836 p.)
File format
unknown
Form of item
online
Isbn
9781613449486
Level of compression
unknown
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other physical details
ill.
Quality assurance targets
not applicable
Reformatting quality
unknown
Reproduction note
Electronic resource.
Sound
unknown sound
Specific material designation
remote

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