The Resource Design for AT-Speed Test, Diagnosis and Measurement, by Benoit Nadeau-Dostie, (electronic book)
Design for AT-Speed Test, Diagnosis and Measurement, by Benoit Nadeau-Dostie, (electronic book)
Resource Information
The item Design for AT-Speed Test, Diagnosis and Measurement, by Benoit Nadeau-Dostie, (electronic book) represents a specific, individual, material embodiment of a distinct intellectual or artistic creation found in Sydney Jones Library, University of Liverpool.This item is available to borrow from 1 library branch.
Resource Information
The item Design for AT-Speed Test, Diagnosis and Measurement, by Benoit Nadeau-Dostie, (electronic book) represents a specific, individual, material embodiment of a distinct intellectual or artistic creation found in Sydney Jones Library, University of Liverpool.
This item is available to borrow from 1 library branch.
- Summary
- This reference offers practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design aims to help solve problems before any DFT is attempted
- Language
- eng
- Isbn
- 9780306475443
- Label
- Design for AT-Speed Test, Diagnosis and Measurement
- Title
- Design for AT-Speed Test, Diagnosis and Measurement
- Statement of responsibility
- by Benoit Nadeau-Dostie
- Language
- eng
- Summary
- This reference offers practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design aims to help solve problems before any DFT is attempted
- Cataloging source
- UkLiU
- http://library.link/vocab/creatorName
- Nadeau-Dostie, Benoit
- LC call number
- TK7874
- Nature of contents
- dictionaries
- Label
- Design for AT-Speed Test, Diagnosis and Measurement, by Benoit Nadeau-Dostie, (electronic book)
- Carrier category
- online resource
- Carrier category code
-
- cr
- Carrier MARC source
- rdacarrier
- Content category
- text
- Content type code
-
- txt
- Content type MARC source
- rdacontent
- Form of item
- electronic
- Isbn
- 9780306475443
- Media category
- computer
- Media MARC source
- rdamedia
- Media type code
-
- c
- Reproduction note
- Electronic resource.
- Specific material designation
- remote
- Label
- Design for AT-Speed Test, Diagnosis and Measurement, by Benoit Nadeau-Dostie, (electronic book)
- Carrier category
- online resource
- Carrier category code
-
- cr
- Carrier MARC source
- rdacarrier
- Content category
- text
- Content type code
-
- txt
- Content type MARC source
- rdacontent
- Form of item
- electronic
- Isbn
- 9780306475443
- Media category
- computer
- Media MARC source
- rdamedia
- Media type code
-
- c
- Reproduction note
- Electronic resource.
- Specific material designation
- remote
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.liverpool.ac.uk/portal/Design-for-AT-Speed-Test-Diagnosis-and/89w3bcI-raM/" typeof="Book http://bibfra.me/vocab/lite/Item"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.liverpool.ac.uk/portal/Design-for-AT-Speed-Test-Diagnosis-and/89w3bcI-raM/">Design for AT-Speed Test, Diagnosis and Measurement, by Benoit Nadeau-Dostie, (electronic book)</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.liverpool.ac.uk/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.liverpool.ac.uk/">Sydney Jones Library, University of Liverpool</a></span></span></span></span></div>
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.liverpool.ac.uk/portal/Design-for-AT-Speed-Test-Diagnosis-and/89w3bcI-raM/" typeof="Book http://bibfra.me/vocab/lite/Item"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.liverpool.ac.uk/portal/Design-for-AT-Speed-Test-Diagnosis-and/89w3bcI-raM/">Design for AT-Speed Test, Diagnosis and Measurement, by Benoit Nadeau-Dostie, (electronic book)</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.liverpool.ac.uk/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.liverpool.ac.uk/">Sydney Jones Library, University of Liverpool</a></span></span></span></span></div>
