Optical measurements -- Congresses
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The concept Optical measurements -- Congresses represents the subject, aboutness, idea or notion of resources found in Sydney Jones Library, University of Liverpool.
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Optical measurements -- Congresses
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The concept Optical measurements -- Congresses represents the subject, aboutness, idea or notion of resources found in Sydney Jones Library, University of Liverpool.
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- 2004 1st IEEE Lightwave Technologies in Instrumentation and Measurement Conference : Palisades, NY, 19-20 October, 2004
- 2009 International Conference on Optical Instruments and Technology : optoelectronic devices and integration : 19-21 October 2009, Shanghai, China
- 2009 International Conference on Optical Instruments and Technology : optoelectronic imaging and process technology : 19-21 October 2009, Shanghai, China
- 2011 International Conference on Optical Instruments and Technology : optoelectronic devices and integration : 6-9 November 2011, Beijing, China
- 2011 International Conference on Optical Instruments and Technology : optoelectronic imaging and processing technology : 6-9 November 2011, Beijing, China
- 2013 International Conference on Optical Instruments and Technology : Optoelectronic Imaging and Processing Technology : 17-19 November 2013, Beijing, China
- 2nd European Congress on Optics Applied to Metrology (METROP) : presented as part of the Optics, Photonics, and Iconics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France
- 35th Australian Conference on Optical Fibre Technology : Melbourne VIC Australia, 5-9 December 2010
- Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA
- Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August 2005, San Diego, California, USA
- Advanced characterization techniques for optics, semiconductors, and nanotechnologies III : 28-29 August 2007, San Diego, California, USA
- Advances in metrology for X-ray and EUV optics V : 18 August 2014, San Diego, California, United States
- Advances in metrology for x-ray and EUV optics : 2-3 August, 2005, San Diego, California, USA
- Advances in metrology for x-ray and EUV optics II : 30 August 2007, San Diego, California, USA
- Advances in metrology for x-ray and EUV optics III : 1-2 August 2010, San Diego, California, United States
- Advances in metrology for x-ray and EUV optics IV : 12 August 2012, San Diego, California, United States
- Advances in optical metrology : August 28-29, 1978, San Diego, California
- Applications of optical fiber sensors : 22-24 May 2000, Glasgow, Scotland, United Kingdom
- Applications of optical metrology--techniques and measurements II : [proceedings] April 7-8, 1983, Arlington, Virginia
- Applied advanced optical metrology solutions : 10-12 August 2015, San Diego, California, United States
- Automated optical inspection for industry : 6-7 November 1996, Beijing, China
- Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China
- Chemical, biochemical, and environmental applications of fibers : 8-9 September 1988, Boston, Massachusetts
- Coherent measuring and data processing methods and devices
- Colloquium on "Measurements on Optical Devices" : on Thursday, 19 November 1992
- Crystal growth in space and related optical diagnostics : 22-23 July 1991, San Diego, California
- Design, manufacturing, and testing of smart structures, micro- and nano-optical devices, and systems : 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies : 26-29 April 2012, Xiamen, China
- Dimensional optical metrology and inspection for practical applications : 22-23 August 2011, San Diego, California, United States
- Dimensional optical metrology and inspection for practical applications II : 25-26 August 2013, San Diego, California, United States
- Dimensional optical metrology and inspection for practical applications III : 5-6 May 2014, Baltimore, Maryland, United States
- Dimensional optical metrology and inspection for practical applications IV : 20-21 April 2015, Baltimore, Maryland, United States
- Eighth International Symposium on Precision Engineering Measurements and Instrumentation : 8-11 August 2012, Chengdu, China
- Field measurement and calibration using electrooptical equipment : issues and requirements, August 24-25, 1982, San Diego, California
- First European Conference on Optics Applied to Metrology, October 26-28, 1977, Strasbourg (France)
- First International Workshop on Classical and Quantum Interference : 25-26 October 2001, Olomouc, Czech Republic
- Flat panel display technology and display metrology : 27-29 January 1999, San Jose, California
- Flat panel display technology and display metrology II : 22-23 January, 2001, San Jose, [California] USA
- Fourth International Symposium on Precision Mechanical Measurements : 25-29 August 2008, Hefei/Jiuhua Mountain, Anhui, China
- Fringe 2009 : 6th International Workshop on Advanced Optical Metrology
- Harnessing light : optical science and metrology at NIST : 1 August 2001, San Diego, USA
- High-performance optical spectrometry : 1-5 June 1992, Warsaw, Poland
- ICALEO '89 : optical sensing and measurement
- ICONO '95 : atomic and quantum optics : high-precision measurements, 27 June-1 July, 1995, St. Petersburg, Russia
- ICONO '98 : quantum optics, interference phenomena in atomic systems, and high-precision measurements : 29 June-3 July 1998, Moscow, Russia
- INTERNATIONAL CONFERENCE ON ADVANCED PHASE MEASUREMENT METHODS IN OPTICS AND IMAGING
- IUTAM Symposium on Advanced Optical Methods and Applications in Solid Mechanics : proceedings of the IUTAM Symposium held in Futuroscope, Poitiers, France, August 31st - September 4th 1998
- Imaging and vision : Opto-Ireland 2005 : 5-6 April 2005, Dublin, Ireland
- In-process optical measurements and industrial methods : 14-15 March 1990, the Hague, the Netherlands : proceedings, ECO3, the congress of EPS--European Physical Society, Europtica--the European Federation for Applied Optics, SPIE--the International Society for Optical Engineering
- In-process optical metrology for precision machining, 31 March-2 April 1987, the Hague, the Netherlands
- Industrial optical sensors for metrology and inspection : 31 October-1 November 1994, Boston, Massachusetts
- Integrated circuit metrology, inspection, and process control IX : 20-22 February 1995, Santa Clara, California
- Integrated circuit metrology, inspection, and process control VIII : 28 February-2 March, San Jose, California
- Interferometric metrology : 20-21, August 1987, San Diego, California
- International Conference on Applied Optical Metrology : 8-11 June 1998, Balatonfu+{u0088}red, Hungary
- International Conference on Lasers for Measurements and Information Transfer : 8-9 June 2000, St. Petersburg, Russia
- International Seminar on Novel Trends in Nonlinear Laser Spectroscopy and High-precision Measurements in Optics : 21-26 September 2000, Vladimir/Suzdal, Russia
- International Symposium on Optoelectronic Technology and Application 2014 : 13-15 May 2014, Beijing, China, Laser and optical measurement technology; and Fibre optic sensors
- Laser applications : Laser Optics '93, 21-25 June 1993, St. Petersburg, Russia
- Laser metrology for precision measurement and inspection in industry : 13-15 October 1999, Floriano+ѓpolis, Brazil
- Lasers for Measurements and Information Transfer, 2002 : 5-7 June, 2002, St. Petersburg, Russia
- Lasers for measurements and information transfer 2003 : 25-27 June 2003, St. Petersburg, Russia
- Lasers for measurements and information transfer 2004 : 23-25 June 2004, St. Petersburg, Russia
- Lasers for measurements and information transfer 2005 : 8-10 June, 2005, St. Petersburg, Russia
- Lasers for measurements and information transfer 2006 : 6-8 June, 2006, St. Petersburg, Russia
- Lasers for measurements and information transfer 2007 : 5-7 June 2007, St. Petersburg, Russia
- Lightmetry : metrology, spectroscopy, and testing techniques using light : 5-8 June 2000, Pultusk, Poland
- Lightmetry, 2002 : metrology and testing techniques using light : 14-16 May, 2002, Warsaw, Poland
- Machine vision systems for inspection and metrology VII : 4-5 November, 1998, Boston, Massachusetts
- Machine vision systems for inspection and metrology VIII : 21-22 September 1999, Boston, Massachusetts
- Measurements of optical radiations, August 29-30, 1979, San Diego, California
- Metrology of optoelectronic systems : 21-22 May 1987, Orlando, Florida
- Modeling aspects in optical metrology : 18-19 June 2007, Munich, Germany
- Modeling aspects in optical metrology II : 15-16 June 2009, Munich, Germany
- Modeling aspects in optical metrology III : 23-24 May 2011, Munich, Germany
- Modeling aspects in optical metrology IV : 13-14 May 2013, Munich, Germany
- Modeling aspects in optical metrology V : 23-25 June 2015, Munich, Germany
- Nano- and micro-metrology : 16-17 June, 2005, Munich, Germany
- Nanotechnology and nanophotonics : Opto-Ireland 2005 : 5-6 April 2005, Dublin, Ireland
- Ninth International Symposium on Precision Engineering Measurement and Instrumentation : 8-10 August 2014, Changsha, China
- Optical 3D measurement techniques II : applications in inspection, quality control, and robotics : 4-7 October 1993, Zu+{u0088}rich, Switzerland
- Optical Metrology and Inspection for Industrial Applications II : 5-7 November 2012, Beijing, China
- Optical diagnostic methods for inorganic materials II : 3-4 August 2000, San Diego, USA
- Optical diagnostic methods for inorganic transmissive materials : 20-21 July 1998, San Diego, California
- Optical diagnostics : 3-4 August 2005, San Diego, California, USA
- Optical diagnostics for fluids, solids, and combustion : July 31-2 August 2001, San Diego, USA
- Optical diagnostics for fluids, solids, and combustion II : 3-4 August, 2003, San Diego, California, USA
- Optical diagnostics for fluids/heat/combustion and photomechanics for solids : 21-23 July 1999, Denver, Colorado
- Optical diagnostics for industrial applications : 22-24 May 2000, Glasgow, Scotland, United Kingdom
- Optical inspection and metrology for non-optics industries : 3-4 August 2009, San Diego, California, United States
- Optical measurement and nondestructive testing : techniques and applications : 8-10 November 2000, Beijing, China
- Optical measurements, modeling, and metrology : proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics, Volume 5
- Optical methods in atmospheric chemistry : 22-24 June 1992, Berlin, FRG
- Optical methods in energy conversion : June 23-25, 1975, Rochester, N.Y.
- Optical metrology and inspection for industrial applications : 18-20 October 2010
- Optical metrology and inspection for industrial applications III : 9-11 October 2014, Beijing, China
- Optical metrology for arts and multimedia : 25-26 June, 2003, Munich, Germany
- Optical micro and nanometrology V : 15-17 April 2014, Brussels, Belgium
- Optical micro- and nanometrology III : 13-16 April 2010, Brussels, Belgium
- Optical micro- and nanometrology IV : 16-18 April 2012, Brussels, Belgium
- Optical micro- and nanometrology in microsystems technology : 5-7 April, 2006, Strasbourg, France
- Optical micro- and nanometrology in microsystems technology II : 8-10 April 2008, Strasbourg, France
- Optical sensing : 27-29 April 2004, Strasbourg, France
- Optical sensing : techniques, benefits, costs : December 7-8, 1982, Teddington, Middlesex, England
- Optical sensing II : 3-6 April, 2006, Strasbourg, France
- Optical sensing and spectroscopy : Opto-Ireland 2005 : 5-6 April 2005, Dublin, Ireland
- Optical techniques for sensing and measurement in hostile environments : 21-22 May 1987, Orlando, Florida
- Optical techniques in fluid, thermal, and combustion flow : 10-13 July 1995, San Diego, California
- Optical technology in fluid, thermal, and combustion flow III : 28-31 July 1997, San Diego, California
- Optical test and measurement technology and equipment : 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies : 2-5 November, 2005, Xian, China
- Optical test and measurement technology and equipment : 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies : 8-12 July 2007, Chengdu, China
- Optical test and measurement technology and equipment : 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies : 19-21 November 2008, Chengdu, China
- Optical test and measurement technology and equipment : 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies : 26-29 April 2010, Dalian, China
- Optical test and measurement technology and equipment : 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies : 26-29 April 2012, Xiamen, China
- Optical testing and metrology : 3-6 June 1986, Québec City, Canada
- Optical testing and metrology II : 27-30 June 1988, Dearborn, Michigan
- Optical testing and metrology III : recent advances in industrial optical inspection : 8-13 July 1990, San Diego, California
- Optics in engineering measurement : 3-6 December 1985, Cannes, France
- Optics in metrology and quality assurance : February 6-7, 1980, Los Angeles, California
- Opto-Ireland 2002 : optical metrology, imaging, and machine vision : 5-6 September 2002, Galway, Ireland
- Optoelectronic imaging and processing technology : 2015 International Conference on Optical Instruments and Technology : 17-19 May 2015, Beijing, China
- Optoelectronic information systems and processing : papers from selected sessions of the First Asia-Pacific Conference on Fundamental Problems of Opto- and Microelectronics : 11-15 September 2000, Vladivostok, Russia
- Optoelectronic metrology : 28-30 September, 1998, ¿ѓan+ѓcut, Poland
- Optoelectronics, photonic devices, and optical networks : Opto-Ireland 2005 : 4-6 April 2005, Dublin, Ireland
- Photometric engineering of sources and systems : 29-30 July 1997, San Diego, California
- Photonic engineering : Opto-Ireland 2005 : 4-6 April 2005, Dublin, Ireland
- Polarization science and remote sensing : 3-5 August 2003, San Diego, California, USA
- Polarization science and remote sensing II : 2-4 August 2005, San Diego, California, USA
- Polarization science and remote sensing III : 29-30 August 2007, San Diego, California, USA
- Polarization science and remote sensing IV : 3-4 August 2009, San Diego, California, United States
- Polarization science and remote sensing V : 21-22 August 2011, San Diego, California, United States
- Polarization science and remote sensing VI : 26 and 28-29 August 2013, San Diego, California, United States
- Polarization science and remote sensing VII : 11-12 August 2015, San Diego, California, United States
- Precision surface metrology : August 23-24, 1983, San Diego, California
- Proceedings of the ... IEEE Conference on Lightwave Technologies in Instrumentation and Measurement
- Real-time measurements, rogue events, and emerging applications : 15-16 February 2016, San Francisco, California, United States
- Real-time photonic measurements, data management, and processing : 9-11 October 2014, Beijing, China
- Real-time photonic measurements, data management, and processing II : 12-13 October 2016, Beijing, China
- Recent developments in optical gauge block metrology : 20-21 July 1998, San Diego, California
- Recent developments in traceable dimensional measurements : 20-21 June 2001, Munich, Germany
- Recent developments in traceable dimensional measurements II : 4-6 August, 2003, San Diego, California
- Recent developments in traceable dimensional measurements III : 31 July-1 August 2005, San Diego, California
- Reflection, Scattering, and Diffraction from Surfaces VI : 20 August 2016 San Diego, California, United States
- Reflection, scattering, and diffraction from surfaces II : 2-4 August 2010, San Diego, California, United States
- Reflection, scattering, and diffraction from surfaces III : 13-16 August 2012, San Diego, California, United States
- Reflection, scattering, and diffraction from surfaces IV : 17-18 August 2014, San Diego, California, United States
- Second International Conference on Lasers for Measurement and Information Transfer : 6-8 June, 2001, St. Petersburg, Russia
- Seventh International Symposium on Precision Engineering Measurements and Instrumentation : 7-11 August 2011, Lijiang, China
- Seventh International Symposium on Precision Mechanical Measurements : : 8-12 August 2015, Xia'men, China
- Sixth International Symposium on Precision Mechanical Measurements : 8-12 August, 2013, Guiyang, China
- Surface scattering and diffraction III : 4-6 August, 2003, San Diego, California, USA
- Surface scattering and diffraction for advanced metrology : 1 August 2001, San Diego, USA
- Surface scattering and diffraction for advanced metrology II : 9 July, 2002, Seattle, Washington, USA
- The International Conference on Photonics and Optical Engineering (icPOE 2014) : 13-15 October 2014, Xi'an, China
- Third International Symposium on Precision Mechanical Measurements : 2-6 August 2006, Urumqi, Xinjiang, China
- Three-dimensional and unconventional imaging for industrial inspection and metrology : 23-25 October 1995, Philadelphia, Pennsylvania
- Three-dimensional imaging and laser-based systems for metrology and inspection II : 20-21 November, 1996, Boston, Massachusetts
- Three-dimensional imaging, optical metrology, and inspection IV : 2-3 November, 1998, Boston, Massachusetts
- Two- and three-dimensional methods for inspection and metrology III : 24-26 October 2005, Boston, Massachusetts, USA
- Two- and three-dimensional methods for inspection and metrology IV : 1-3 October, 2006, Boston, Massachusetts, USA
- Two- and three-dimensional methods for inspection and metrology V : 11-12 September 2007, Boston, Massachusetts, USA
- Two- and three-dimensional vision systems for inspection, control, and metrology : 29-30 October 2003, Providence, Rhode Island, USA
- Two- and three-dimensional vision systems for inspection, control, and metrology II : 26-27 October, 2004, Philadelphia, Pennsylvania, USA
- Videometrics II : 9-10 September 1993, Boston, Massachusetts
- Videometrics III : 2-4 November 1994, Boston, Massachusetts
- Videometrics IV : 25-26 October 1995, Philadelphia, Pennsylvania
- Videometrics V : 30-31 July 1997, San Diego, California
- Videometrics and optical methods for 3D shape measurement : 22-23 January 2001, San Jose, [California] USA
- Wavefront sensing : August 24-25, 1982, San Diego, California
- X-ray optics design, performance, and applications : 20-21 July 1999, Denver, Colorado
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